Proton damage effects in EEV charge coupled devices.

HOLLAND A; ABBEY A; LUMB D; MCCARTHY K

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J-GLOBAL ID：200902034129384712 Reference number：91A0254943

Proton damage effects in EEV charge coupled devices.

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Author (4)： , , ,
Material：
Volume： 1344 Page： 378-395 Publication year： 1990
JST Material Number： D0943A ISSN： 0277-786X CODEN： PSISDG Document type： Proceedings
Country of issue： United States (USA) Language： ENGLISH (EN)

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