Art
J-GLOBAL ID：200902035674198116
Reference number：90A0091574
Annular dark field electron microscope images with better than 2Å resolution at 100kV.
100kVでの解像度が2Åより優れたアンニュラ暗視野電子顕微鏡像
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Author (3)：
,
,
Material：
Volume：
55
Issue：
23
Page：
2456-2458
Publication year：
Dec. 04, 1989
JST Material Number：
H0613A
ISSN：
0003-6951
CODEN：
APPLAB
Document type：
Article
Article type：
短報
Country of issue：
United States (USA)
Language：
ENGLISH (EN)
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All keywords is available on JDreamIII(charged).
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Microscopy determination of structures
, 超伝導状態の性質一般【’81~’92】
Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
,
,
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