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J-GLOBAL ID：200902041823436084   Reference number：81A0367997

Total internal reflection microscopy: a surface inspection technique.

内部全反射顕微法 表面検査技術
Author (1)：
TEMPLE P A

About TEMPLE P A

(U.S. Naval Weapons Center, California)

About U.S. Naval Weapons Center, California


Material：
Applied Optics  (Lasers, Photonics, and Environmental Optics)

About Applied Optics


Volume： 20  Issue： 15  Page： 2656-2664  Publication year： Aug. 01, 1981 
JST Material Number： B0026B  ISSN： 1559-128X  CODEN： APOPAI  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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optical microscopy

About optical microscopy

,...
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JST classification (3)：
JST classification
Category name(code) classified by JST.
Optical microscopes,telescopes 
(QF05050R)

About Optical microscopes,telescopes

,  Surface structure of solids in general 
(BK15010E)

About Surface structure of solids in general

,  Nondestructive testing 
(HB02030F)

About Nondestructive testing

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
内部全反射

About 内部全反射

, 
顕微法

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, 
表面検査

About 表面検査


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