Art
J-GLOBAL ID：200902043009753292
Reference number：91A0321239
Correlations of single-crystal CuInSe2 surface processing with defect levels and cell performance.
欠陥準位および電池性能と単結晶CuInSe2表面処理の相関
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Author (4)：
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Material：
Volume：
21st
Issue：
Vol 1
Page：
541-545
Publication year：
1990
JST Material Number：
E0756A
ISSN：
0160-8371
Document type：
Proceedings
Article type：
原著論文
Country of issue：
United States (USA)
Language：
ENGLISH (EN)
Thesaurus term：
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Photodetectors
, Lattice defects in semiconductors
Terms in the title (5)：
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