Art
J-GLOBAL ID：200902045364668592
Reference number：82A0105151
The application of convergent-beam electron diffraction to the detection of small symmetry changes accompanying phase transformations. I. General and methods.
相変態に伴う小さな対称性変化の検出への収束ビーム電子回折の適用 I 概説と方法
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Author (4)：
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Material：
Volume：
44
Issue：
5
Page：
1117-1133
Publication year：
Nov. 1981
JST Material Number：
E0753B
ISSN：
0141-8610
CODEN：
PMAADG
Document type：
Article
Article type：
原著論文
Country of issue：
United Kingdom (GBR)
Language：
ENGLISH (EN)
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Electron diffraction methods
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