Art
J-GLOBAL ID:200902048745876271   Reference number:89A0113378

Depth profiling of element concentration using low energy proton induced X-ray emission.

低エネルギー陽子誘起X線放出を利用した元素濃度の深さ方向プロフィル
Author (3):
Material:
Volume: 35  Issue: 3/4  Page: 319-325  Publication year: Dec. 1988 
JST Material Number: H0899A  ISSN: 0168-583X  Document type: Article
Article type: 原著論文  Country of issue: Netherlands (NLD)  Language: ENGLISH (EN)
Thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
,...
Semi thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=89A0113378&from=J-GLOBAL&jstjournalNo=H0899A") }}
JST classification (1):
JST classification
Category name(code) classified by JST.
Radiochemical analysis of elements in inorganic substances 

Return to Previous Page