Art
J-GLOBAL ID：200902049667163472   Reference number：83A0091390

Methods of computing optical properties and combating aberrations for low-intensity beams.

低密度ビームの光学的特性を計算し収差に打勝つ方法
Author (1)：
HAWKES P W

About HAWKES P W

(Lab. Optique Electronique Centre National de la Recherche Scientifique, France)

About Lab. Optique Electronique Centre National de la Recherche Scientifique, France


Material：
Advances in Electronics and Electron Physics  (Adv Electron Electron Phys)

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Issue： Suppl 13A  Page： 45-157  Publication year： 1980 
JST Material Number： A0364B  ISSN： 0065-2539  CODEN： AEEPA  Document type： Article
Article type： 原著論文  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)
Thesaurus term：
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All keywords is available on JDreamIII(charged).
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electron lens

About electron lens

,...
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JST classification (1)：
JST classification
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Electron lens,electron energy analysers 
(BD02040Q)

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Terms in the title (5)：
Terms in the title
Keywords automatically extracted from the title.
低密度

About 低密度

, 
ビーム

About ビーム

, 
光学的特性

About 光学的特性

, 
計算

About 計算

, 
収差

About 収差


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