Art
J-GLOBAL ID：200902051588398124   Reference number：83A0255785

Impact of scaling on MOS analog performance.

MOSアナログ性能へのスケーリングの影響
Author (2)：
WONG S

About WONG S

(Univ. Toronto, Canada)

About Univ. Toronto, Canada

, 
SALAMA C A T

About SALAMA C A T

(Univ. Toronto, Canada)

About Univ. Toronto, Canada


Material：
IEEE Journal of Solid-State Circuits  (IEEE J Solid-State Circuits)

About IEEE Journal of Solid-State Circuits


Volume： 18  Issue： 1  Page： 106-114  Publication year： Feb. 1983 
JST Material Number： B0761A  ISSN： 0018-9200  CODEN： IJSCBC  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
MOS structure

About MOS structure

,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=83A0255785&from=J-GLOBAL&jstjournalNo=B0761A") }}
JST classification (2)：
JST classification
Category name(code) classified by JST.
General 
(NC03161C)

About General

,  Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
MOS

About MOS

, 
アナログ

About アナログ

, 
スケーリング

About スケーリング


Return to Previous Page

TOP

BOTTOM