Art
J-GLOBAL ID：200902062680593970   Reference number：81A0302657

X-ray diffraction study of the Ge(001) reconstructed surface.

Ge(001)再構成表面のX線回折
Author (2)：
EISENBERGER P

About EISENBERGER P

(Bell Lab., New Jersey)

About Bell Lab., New Jersey

, 
MARRA W C

About MARRA W C

(Bell Lab., New Jersey)

About Bell Lab., New Jersey


Material：
Physical Review Letters  (Phys Rev Lett)

About Physical Review Letters


Volume： 46  Issue： 16  Page： 1081-1084  Publication year： Apr. 20, 1981 
JST Material Number： H0070A  ISSN： 0031-9007  CODEN： PRLTAO  Document type： Article
Article type： 短報  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
X-ray diffraction

About X-ray diffraction

,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=81A0302657&from=J-GLOBAL&jstjournalNo=H0070A") }}
JST classification (2)：
JST classification
Category name(code) classified by JST.
Surface structure of semiconductors 
(BK15030A)

About Surface structure of semiconductors

,  X-ray diffraction methods 
(BK01020I)

About X-ray diffraction methods

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
Ge

About Ge

, 
再構成

About 再構成

, 
X線回折

About X線回折


Return to Previous Page

TOP

BOTTOM