Art
J-GLOBAL ID：200902064100719983
Reference number：84A0429022
Comparison of micron and submicron fly ash particles using scanning electron microscopy and X-ray elemental analysis.
走査電子顕微鏡及びX線元素分析法を用いるミクロン及びサブミクロンフライアッシュ粒子の比較
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Author (2)：
,
Material：
Volume：
18
Issue：
7
Page：
544-547
Publication year：
Jul. 1984
JST Material Number：
B0839A
ISSN：
0013-936X
CODEN：
ESTHA
Document type：
Article
Article type：
原著論文
Country of issue：
United States (USA)
Language：
ENGLISH (EN)
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Examination and measurement of granular matter
Terms in the title (3)：
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