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J-GLOBAL ID:200902067156256969   Reference number:92A0408856

X-ray diffraction and thermal wave analysis of primary recrystallization in electrodeposited copper layers at room temperature.

室温で電着した銅層中の一次再結晶のX線回折と熱波解析
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Volume: 22  Issue:Page: 464-470  Publication year: May. 1992 
JST Material Number: B0393B  ISSN: 0021-891X  Document type: Article
Article type: 原著論文  Country of issue: Netherlands (NLD)  Language: ENGLISH (EN)
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Electroplating 

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