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J-GLOBAL ID：200902068518341931   Reference number：83A0028041

Picosecond electro-optic sampling system.

ピコ秒のオプトエレクロニクス式サンプリングシステム
Author (3)：
VALDMANIS J A

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(Univ. Rochester, New York)

About Univ. Rochester, New York

, 
MOUROU G

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(Univ. Rochester, New York)

About Univ. Rochester, New York

, 
GABEL C W

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(Univ. Rochester, New York)

About Univ. Rochester, New York


Material：
Applied Physics Letters  (Appl Phys Lett)

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Volume： 41  Issue： 3  Page： 211-212  Publication year： Aug. 01, 1982 
JST Material Number： H0613A  ISSN： 0003-6951  CODEN： APPLAB  Document type： Article
Article type： 短報  Country of issue： United States (USA)  Language： ENGLISH (EN)
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JST classification (3)：
JST classification
Category name(code) classified by JST.
Electrical/magnetic experimental techniques 
(BA02050S)

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,  Electrooptical effects,magnetooptical effects 
(BM08020L)

About Electrooptical effects,magnetooptical effects

,  Photometry and photodetectors in general 
(BD07031F)

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サンプリングシステム

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