Art
J-GLOBAL ID：200902069282686386   Reference number：82A0431645

分散形ELの劣化とS空孔との関係

Author (3)：
HIRABAYASHI KATSUHIKO

About HIRABAYASHI KATSUHIKO

(電電公社茨城電通研)

About 電電公社茨城電通研

, 
KOZAWAGUCHI HARUKI

About KOZAWAGUCHI HARUKI

(電電公社茨城電通研)

About 電電公社茨城電通研

, 
TSUJIYAMA BUNJIRO

About TSUJIYAMA BUNJIRO

(電電公社茨城電通研)

About 電電公社茨城電通研


Material：
電子通信学会技術研究報告

About 電子通信学会技術研究報告


Volume： 82  Issue： 68  Page： 29-36(CPM82-12)  Publication year： Jun. 25, 1982 
JST Material Number： S0532B  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： JAPANESE (JA)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
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electroluminescence

About electroluminescence

,...
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Luminescence of semiconductors 
(BM08092S)

About Luminescence of semiconductors

,  Light emitting devices 
(NC03082G)

About Light emitting devices

Terms in the title (2)：
Terms in the title
Keywords automatically extracted from the title.
EL

About EL

, 
空孔

About 空孔


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