Art
J-GLOBAL ID：200902070193627196   Reference number：92A0434384

Testability Measures in Pseudorandom Testing.

擬似ランダム試験における可試験性の測定
Author (5)：
ERCOLANI S

About ERCOLANI S

(Univ. Bologna, Bologna, ITA)

About Univ. Bologna, Bologna, ITA

, 
FAVALLI M

About FAVALLI M

(Univ. Bologna, Bologna, ITA)

About Univ. Bologna, Bologna, ITA

, 
DAMIANI M

About DAMIANI M

(Univ. Bologna, Bologna, ITA)

About Univ. Bologna, Bologna, ITA

, 
OLIVO P

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(Univ. Bologna, Bologna, ITA)

About Univ. Bologna, Bologna, ITA

, 
RICCO B

About RICCO B

(Univ. Bologna, Bologna, ITA)

About Univ. Bologna, Bologna, ITA


Material：
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  (IEEE Trans Comput-Aided Des Integr Circuits Syst)

About IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems


Volume： 11  Issue： 6  Page： 794-800  Publication year： Jun. 1992 
JST Material Number： B0142C  ISSN： 0278-0070  CODEN： ITCSDI  Document type： Article
Article type： 短報  Country of issue： United States (USA)  Language： ENGLISH (EN)
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testability

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,...
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
擬似ランダム

About 擬似ランダム

, 
試験

About 試験

, 
可試験性

About 可試験性


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