Art
J-GLOBAL ID：200902071346370544   Reference number：86A0303830

The impact of surface mount devices on in-circuit testing.

面実装部品(SMD)がインサーキット試験に与える問題
Author (1)：
BULLOCK M

About BULLOCK M

(Hewlett-Packard Co., CO)

About Hewlett-Packard Co., CO


Material：
Proceedings of the National Communications Forum  (Proc Natl Commun Forum)

About Proceedings of the National Communications Forum


Volume： 39  Page： 667-670  Publication year： 1985 
JST Material Number： H0316A  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
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integrated circuit

About integrated circuit

,...
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

,  Methods and instruments for measuring other electromagnetic quantities 
(AD07070F)

About Methods and instruments for measuring other electromagnetic quantities

Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
面実装部品

About 面実装部品

, 
SMD

About SMD

, 
サーキット

About サーキット

, 
試験

About 試験


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