Art
J-GLOBAL ID：200902073366060242   Reference number：85A0360985

A software reliability growth model with two types of errors.

誤差の2種類のタイプを持つソフトウエアの信頼性成長モデル
Author (3)：
YAMADA S

About YAMADA S

(Okayama Univ. Science)

About Okayama Univ. Science

, 
OSAKI S

About OSAKI S

(Hiroshima Univ.)

About Hiroshima Univ.

, 
NARIHISA H

About NARIHISA H

(Okayama Univ. Science)

About Okayama Univ. Science


Material：
RAIRO. Recherche Operationnelle  (RO)

About RAIRO. Recherche Operationnelle


Volume： 19  Issue： 1  Page： 87-104  Publication year： Feb. 1985 
JST Material Number： C0814A  ISSN： 0399-0559  Document type： Article
Article type： 原著論文  Country of issue： France (FRA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
software

About software

,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=85A0360985&from=J-GLOBAL&jstjournalNo=C0814A") }}
JST classification (2)：
JST classification
Category name(code) classified by JST.
Computer system development 
(JD02010R)

About Computer system development

,  Reliability 
(KB04040H)

About Reliability

Terms in the title (5)：
Terms in the title
Keywords automatically extracted from the title.
誤差

About 誤差

, 
タイプ

About タイプ

, 
ソフトウエア

About ソフトウエア

, 
信頼性成長

About 信頼性成長

, 
モデル

About モデル


Return to Previous Page

TOP

BOTTOM