About WEST M A
About IBM, NY
About DeFOSTER S M
About IBM, NY
About BALDWIN E C
About IBM, NY
About ZIEGLER R A
About IBM, NY
About IBM Journal of Research and Development
About flaw inspection
About image dissector
About Measurement,testing and reliability of solid-state devices
About Printed circuits
About プリント基板
About 計算制御
About 光学テスト