Art
J-GLOBAL ID：200902079498498792   Reference number：87A0336642

Aberration analysis of a crossed-field analyzer.

交差電磁界型分析器の収差解析
Author (1)：
TANG T-T

About TANG T-T

(Xi’an Jiaotong Univ., Xi’an, CHN)

About Xi’an Jiaotong Univ., Xi’an, CHN


Material：
Optik  (International Journal for Light and Electron Optics)

About Optik


Volume： 74  Issue： 2  Page： 51-56  Publication year： Sep. 1986 
JST Material Number： D0251A  ISSN： 0030-4026  Document type： Article
Article type： 原著論文  Country of issue： Netherlands (NLD)  Language： ENGLISH (EN)
Thesaurus term：
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ion optics

About ion optics

,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
crossed electric and magnetic field

About crossed electric and magnetic field


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JST classification (2)：
JST classification
Category name(code) classified by JST.
Particle optics in general 
(BD02010J)

About Particle optics in general

,  Electron lens,electron energy analysers 
(BD02040Q)

About Electron lens,electron energy analysers

Terms in the title (5)：
Terms in the title
Keywords automatically extracted from the title.
交差

About 交差

, 
電磁界

About 電磁界

, 
分析器

About 分析器

, 
収差

About 収差

, 
解析

About 解析


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