Art
J-GLOBAL ID：200902082993694760
Reference number：85A0103867
Deconvolution of defect leakage field profiles obtained by using hall element probes.
ホール素子型探触子を用いて得られる欠陥漏れ磁界模様の非旋回性
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Author (2)：
,
Material：
Page：
855-862
Publication year：
1984
JST Material Number：
K19840625
ISBN：
0-306-41678-6
Document type：
Proceedings
Article type：
原著論文
Country of issue：
United States (USA)
Language：
ENGLISH (EN)
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Thesaurus term/Semi thesaurus term
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Nondestructive testing
Terms in the title (6)：
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