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Art
J-GLOBAL ID:200902087230994170   Reference number:85A0366926

Both surface inequi-thickness removal - both surface X-ray diffraction method for residual stress measurement in a plate.

両面不等厚除去・両面X線照射法による平板の残留応力測定
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Material:
Volume: 51  Issue: 467  Page: 1710-1716  Publication year: Jul. 1985
JST Material Number: F0227B  ISSN: 0387-5008  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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JST classification (2):
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Mechanics of elasticity in general  ,  Nondestructive testing 
Reference (4):
  • (1) 上肥•佐藤,機論,36-289(昭45},1413,
  • (2) 上肥•井村,機論,48-425, A(昭57),95.
  • (3) 上肥•井村,機論,49-441,A(昭58),589.
  • (4) 上肥•井村,機論,49-445,A(紹58),1089.
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