Art
J-GLOBAL ID：200902087230994170
Reference number：85A0366926
Both surface inequi-thickness removal - both surface X-ray diffraction method for residual stress measurement in a plate.
両面不等厚除去・両面X線照射法による平板の残留応力測定
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Author (2)：
,
Material：
Volume：
51
Issue：
467
Page：
1710-1716
Publication year：
Jul. 1985
JST Material Number：
F0227B
ISSN：
0387-5008
Document type：
Article
Article type：
原著論文
Country of issue：
Japan (JPN)
Language：
JAPANESE (JA)
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Mechanics of elasticity in general
, Nondestructive testing
Reference (4)：
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(1) 上肥•佐藤,機論,36-289(昭45},1413,
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(2) 上肥•井村,機論,48-425, A(昭57),95.
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(3) 上肥•井村,機論,49-441,A(昭58),589.
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(4) 上肥•井村,機論,49-445,A(紹58),1089.
Terms in the title (6)：
Terms in the title
Keywords automatically extracted from the title.
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