Art
J-GLOBAL ID：200902089208023201   Reference number：81A0017591

Instrumentation for the size determination of submicron particulates systems by sideway light scattering method.

サブミクロン粒子系の寸法を側方光散乱法により決定する装置
Author (1)：
SUDA K

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(Hitachi Ltd., Tokyo)

About Hitachi Ltd., Tokyo


Material：
Review of Scientific Instruments  (Rev Sci Instrum)

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Volume： 51  Issue： 8  Page： 1049-1058  Publication year： Aug. 1980 
JST Material Number： D0517A  ISSN： 0034-6748  CODEN： RSINAK  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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particle

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,...
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Measuring methods and instruments of length,area,cross section,volume,angle 
(AD05020O)

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Terms in the title (2)：
Terms in the title
Keywords automatically extracted from the title.
サブミクロン粒子

About サブミクロン粒子

, 
光散乱法

About 光散乱法


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