Art
J-GLOBAL ID：200902089291412249   Reference number：84A0304642

Random pattern testability.

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Author (3)：
SAVIR J

About SAVIR J

(IBM, NY)

About IBM, NY

, 
DITLOW G S

About DITLOW G S

(IBM, NY)

About IBM, NY

, 
BARDELL P H

About BARDELL P H

(IBM, NY)

About IBM, NY


Material：
IEEE Transactions on Computers  (IEEE Trans Comput)

About IEEE Transactions on Computers


Volume： 33  Issue： 1  Page： 79-90  Publication year： Jan. 1984 
JST Material Number： C0233A  ISSN： 0018-9340  CODEN： ICTOB4  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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logic circuit

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,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
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On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
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Logic circuits 
(NC05070B)

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