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J-GLOBAL ID:200902089291412249   Reference number:84A0304642

Random pattern testability.

ランダムパターン検査可能性
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Volume: 33  Issue:Page: 79-90  Publication year: Jan. 1984 
JST Material Number: C0233A  ISSN: 0018-9340  CODEN: ICTOB4  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Logic circuits 
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