Art
J-GLOBAL ID：200902089396618020   Reference number：86A0416889

Atomic force microscope.

原子間力顕微鏡
Author (3)：
BINNIG G

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(Stanford Univ., California)

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, 
QUATE C F

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(Xerox, Cal.)

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, 
GERBER C

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(IBM)

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Material：
Physical Review Letters  (Phys Rev Lett)

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Volume： 56  Issue： 9  Page： 930-933  Publication year： Mar. 03, 1986 
JST Material Number： H0070A  ISSN： 0031-9007  CODEN： PRLTAO  Document type： Article
Article type： 短報  Country of issue： United States (USA)  Language： ENGLISH (EN)
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electron microscope

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,...
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スタイラスプロフィロメータ

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,...
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Microscopy determination of structures 
(BK01040E)

About Microscopy determination of structures

,  Surface structure of solids in general 
(BK15010E)

About Surface structure of solids in general

Terms in the title (1)：
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原子間力顕微鏡

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