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J-GLOBAL ID:200902097596386305   Reference number:91A0608845

Tunneling microscopy and spectroscopy on cross sections of molecularbeam-epitaxy-grown (Al)GaAs multilayers.

分子線エピタクシー成長(Al)GaAs多層膜の断面に対するトンネル顕微鏡と分光法
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Material:
Volume:Issue: 2 Pt 2  Page: 779-782  Publication year: Mar. 1991 
JST Material Number: E0974A  ISSN: 1071-1023  CODEN: JVTBD9  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Semiconductor thin films 

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