Art
J-GLOBAL ID：200902099885236373   Reference number：90A0150185

Adsorbed layer and thin film growth modes monitored by Auger electron spectroscopy.

Auger電子分光法によって調べた吸着層および薄膜成長モード
Author (2)：
ARGILE C

About ARGILE C

(Univ. Pierre et Marie Curie, Paris, FRA)

About Univ. Pierre et Marie Curie, Paris, FRA

, 
RHEAD G E

About RHEAD G E

(Univ. Pierre et Marie Curie, Paris, FRA)

About Univ. Pierre et Marie Curie, Paris, FRA


Material：
Surface Science Reports  (Surf Sci Rep)

About Surface Science Reports


Volume： 10  Issue： 6/7  Page： 277-356  Publication year： Nov. 1989 
JST Material Number： E0422B  ISSN： 0167-5729  Document type： Article
Article type： 文献レビュー  Country of issue： Netherlands (NLD)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
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Auger spectrum

About Auger spectrum

,...
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Thin films in general 
(BK14010X)

About Thin films in general

,  Study of adsorption by physical means 
(CB12043P)

About Study of adsorption by physical means

Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
Auger電子分光法

About Auger電子分光法

, 
吸着層

About 吸着層

, 
薄膜

About 薄膜

, 
成長モード

About 成長モード


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