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J-GLOBAL ID:200902101246248233   Reference number:99A0141320

How to measure the nanoscale physical properties of materials?

ナノスケールの物性や機能をどう測るか ナノ構造の「構築」から「計測」へ
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Volume: 67  Issue: 12  Page: 1361-1369  Publication year: Dec. 1998 
JST Material Number: F0252A  ISSN: 0369-8009  CODEN: OYBSA  Document type: Article
Article type: 解説  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Microscopy determination of structures 
Reference (64):
  • 1) G. Binnig and H. Rohrer: Helvetica Phys. Acta 55, 762 (1982): G. Binnig, H. Rohrer, Ch. Gerber and E. Weibel: Phys. Rev. Lett. 49, 57 (1982).
  • 2) R. S. Becker, J. A. Golovchenko and B. S. Swartzentruber: Nature 325, 419 (1987).
  • 3) その成果 Activity Report No.3, Aono Atomcraft Project,ERATO Program, JRDC, March, 1995にまとめられている.次の論文参照:AKobayashi, F. Grey, R. S. Wikklams and M.Aono: Science 259, 1724 (1993): H. Uchida, D. H. Huang, F. Grey and M. Aono: Phys. Rev. Lett. 70, 2024 (1993): M. Aono, A. Kobayashi, F. Grey, H. Uchida and D. H. Huang: Jpn. J. Appl. Phys. 32,1470 (1993) ; H. Kuramochi, H. Uchida and M. Aono: Phys. Rev. Lett. 72, 932 (1994).
  • 4) D. M. Eigler and E. K. Schweizer: Nature 344, 524 (1990).
  • 5) 最近「表面科学」に類似の寄稿をしたが,ここではよりくわしいデータと議論を示す.
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