Art
J-GLOBAL ID：200902103471331061
Reference number：99A0805981
Measurement of radiation effects on VLSI chip.
VLSIの耐放射線性の測定 (東京大学原子力研究総合センターS)
Author (3)：
,
,
Material：
Issue：
UTRCN-K-29
Page：
86-89
Publication year：
Jun. 1998
JST Material Number：
J0430A
Document type：
Article
Article type：
短報
Country of issue：
Japan (JPN)
Language：
ENGLISH (EN)
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Irradiational changes semiconductors
, General
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