Development of a thermal diffusivity measurement system for metal thin films using a picosecond thermoreflectance technique.

TAKETOSHI N; BABA T; ONO A

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J-GLOBAL ID：200902105795825922 Reference number：02A0093654

Development of a thermal diffusivity measurement system for metal thin films using a picosecond thermoreflectance technique.

ピコ秒のサーモリフレクタンス技術を使用した金属薄膜のための熱拡散率の測定系の開発

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Material：
Volume： 12 Issue： 12 Page： 2064-2073 Publication year： Dec. 2001
JST Material Number： C0354C ISSN： 0957-0233 CODEN： MSTCEP Document type： Article
Article type：原著論文 Country of issue： United Kingdom (GBR) Language： ENGLISH (EN)

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Optical instruments and techniques in general , Metallic thin films , Measuring methods and instruments of other thermal variables

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