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J-GLOBAL ID：200902106803884689   Reference number：01A0318258

Spectroscopic ellipsometry of multilayer dielectric coatings.

多層誘電体コーティングの分光偏光解析法
Author (4)：
BHATTACHARYYA D

About BHATTACHARYYA D

(Bhabha Atomic Res. Centre, Mumbai, IND)

About Bhabha Atomic Res. Centre, Mumbai, IND

, 
SAHOO N K

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(Bhabha Atomic Res. Centre, Mumbai, IND)

About Bhabha Atomic Res. Centre, Mumbai, IND

, 
THAKUR S

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(Bhabha Atomic Res. Centre, Mumbai, IND)

About Bhabha Atomic Res. Centre, Mumbai, IND

, 
DAS N C

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(Bhabha Atomic Res. Centre, Mumbai, IND)

About Bhabha Atomic Res. Centre, Mumbai, IND


Material：
Vacuum

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Volume： 60  Issue： 4  Page： 419-424  Publication year： Mar. 2001 
JST Material Number： E0347A  ISSN： 0042-207X  Document type： Article
Article type： 原著論文  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)
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*ellipsometry

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,...
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JST classification (3)：
JST classification
Category name(code) classified by JST.
Optical devices in general 
(BD06010L)

About Optical devices in general

,  Optical properties of condensed matter in general 
(BM08010A)

About Optical properties of condensed matter in general

,  Oxide thin films 
(BK14050P)

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多層

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, 
分光偏光解析法

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