Overall comparison of subpicosecond electron beam diagnostics by the polychromator, the interferometer and the femtosecond streak camera.

WATANABE T; SUGAHARA J; YOSHIMATSU T; SASAKI S; SUGIYAMA Y; ISHI K; SHIBATA Y; KONDO Y; UESAKA M

Art

J-GLOBAL ID：200902106981884781 Reference number：02A0370928

Overall comparison of subpicosecond electron beam diagnostics by the polychromator, the interferometer and the femtosecond streak camera.

ポリクロメータ,干渉計,フェムト秒ストリークカメラで診断したサブピコ秒電子ビームの比較

Publisher site Copy service {{ this.onShowCLink("http://jdream3.com/copy/?sid=JGLOBAL&noSystem=1&documentNoArray=02A0370928&COPY=1") }}
Access JDreamⅢ for advanced search and analysis. {{ this.onShowJLink("http://jdream3.com/lp/jglobal/index.html?docNo=02A0370928&from=J-GLOBAL&jstjournalNo=D0208B") }}

Author (9)： , , , , , , , ,
Material：
Volume： 480 Issue： 2/3 Page： 315-327 Publication year： Mar. 21, 2002
JST Material Number： D0208B ISSN： 0168-9002 Document type： Article
Article type：原著論文 Country of issue： Netherlands (NLD) Language： ENGLISH (EN)

,...
,...

To see more with JDream III (charged). {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=02A0370928&from=J-GLOBAL&jstjournalNo=D0208B") }}

Linear accelerators

, , , , , ,

Return to Previous Page