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J-GLOBAL ID：200902107280832945   Reference number：94A0514986

Advanced LSI Failure Analysis and its Limitation.

LSIの最新故障解析技術とその限界
Author (1)：
MURASE MASAMICHI

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(NEC)

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Material：
電子情報通信学会技術研究報告  (IEICE Technical Report (Institute of Electronics, Information and Communication Engineers))

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Volume： 94  Issue： 52(R94 1-5)  Page： 13-18  Publication year： May. 20, 1994 
JST Material Number： S0532B  ISSN： 0913-5685  Document type： Proceedings
Article type： 原著論文  Country of issue： Japan (JPN)  Language： JAPANESE (JA)
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failure analysis

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,...
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JST classification (1)：
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Measurement,testing and reliability of solid-state devices 
(NC03040G)

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Terms in the title (3)：
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LSI

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, 
故障解析

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, 
限界

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