Graphical peak analysis method for determining densities and emission rates of traps in dielectric film from transient discharge current.

MATSUURA H; HASE T; SEKIMOTO Y; UCHIKURA M; SIMIZU M

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J-GLOBAL ID：200902107495503179 Reference number：02A0267466

Graphical peak analysis method for determining densities and emission rates of traps in dielectric film from transient discharge current.

過渡放電電流から誘電体膜におけるトラップの密度と放出率を決定するためのグラフピーク解析

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Author (5)： , , , ,
Material：
Volume： 91 Issue： 4 Page： 2085-2092 Publication year： Feb. 15, 2002
JST Material Number： C0266A ISSN： 0021-8979 CODEN： JAPIAU Document type： Article
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

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Electronic structure of impurites and defects , Oxide thin films

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