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J-GLOBAL ID：200902108618906555
Reference number：96A0165873
Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy.
原子-トラッキング走査トンネル顕微鏡を用いた表面拡散の直接観察
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Author (1)：
Material：
Volume：
76
Issue：
3
Page：
459-462
Publication year：
Jan. 15, 1996
JST Material Number：
H0070A
ISSN：
0031-9007
CODEN：
PRLTAO
Document type：
Article
Article type：
短報
Country of issue：
United States (USA)
Language：
ENGLISH (EN)
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Surface structure of semiconductors
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