Art
J-GLOBAL ID：200902109948379680
Reference number：99A0344250
Complex Observation in Electron Microscopy. I. Basic Scheme to Surpass the Scherzer Limit.
電子顕微鏡による複素観察 I Scherzer限界を超えるための基本的スキーム
Author (1)：
Material：
Volume：
68
Issue：
3
Page：
811-822
Publication year：
Mar. 15, 1999
JST Material Number：
G0509A
ISSN：
0031-9015
CODEN：
JUPSA
Document type：
Article
Article type：
原著論文
Country of issue：
Japan (JPN)
Language：
ENGLISH (EN)
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Electron and ion microscopes
Reference (98)：
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ZERNIKE, F. Phys. Z. 1935, 36, 848
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ZERNIKE, F. Physica. 1942, 9, 686
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ZERNIKE, F. Phisica. 974
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STROKE, G. W. An Introduction to Coherent Optics and Holography. 1966
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BRUNING, J. H. Appl. Opt. 1974, 13, 2693
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