A New Variational Method to Determine Effective Channel Length and Series Resistance of MOSFET’s.

YAMAGUCHI K; AMISHIRO H; YAMAWAKI M; ASAI S

Art

J-GLOBAL ID：200902111557788725 Reference number：98A0986421

A New Variational Method to Determine Effective Channel Length and Series Resistance of MOSFET’s.

MOSFETの実効チャネル長と直列抵抗を求める新変分法

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Material：
Volume： 1998 Page： 123-126 Publication year： 1998
JST Material Number： T0991A Document type： Proceedings
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

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Measurement,testing and reliability of solid-state devices , General

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