Art
J-GLOBAL ID：200902112224881589   Reference number：99A0390432

Insulator Investigation on SiC for Improved Reliability.

信頼性向上のためのSiC上絶縁体の調査
Author (2)：
LIPKIN L A

About LIPKIN L A

(Cree Res. Inc., NC, USA)

About Cree Res. Inc., NC, USA

, 
PALMOUR J W

About PALMOUR J W

(Cree Res. Inc., NC, USA)

About Cree Res. Inc., NC, USA


Material：
IEEE Transactions on Electron Devices  (IEEE Trans Electron Devices)

About IEEE Transactions on Electron Devices


Volume： 46  Issue： 3  Page： 525-532  Publication year： Mar. 1999 
JST Material Number： C0222A  ISSN： 0018-9383  CODEN： IETDAI  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
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*silicon carbide

About silicon carbide

,...
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Transistors 
(NC03070N)

About Transistors

,  Metal-insulator-semiconductor structures 
(BM03085X)

About Metal-insulator-semiconductor structures

Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
信頼性向上

About 信頼性向上

, 
SiC

About SiC

, 
絶縁体

About 絶縁体

, 
調査

About 調査


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