Art
J-GLOBAL ID：200902113777675100   Reference number：01A1004465

Very Low Cost Testers: Opportunities and Challenges.

超低コストテスタ 機会と挑戦
Author (4)：
BEDSOLE J

About BEDSOLE J

(Motorola)

About Motorola

, 
RAINA R

About RAINA R

(Motorola)

About Motorola

, 
CROUCH A

About CROUCH A

(Motorola)

About Motorola

, 
ABADIR M S

About ABADIR M S

(Motorola)

About Motorola


Material：
IEEE Design & Test of Computers  (IEEE Des Test Comput)

About IEEE Design & Test of Computers


Volume： 18  Issue： 5  Page： 60-69  Publication year： Sep. 2001 
JST Material Number： B0007C  ISSN： 0740-7475  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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*VLSI

About VLSI

,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
design for testability

About design for testability


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JST classification (1)：
JST classification
Category name(code) classified by JST.
General 
(NC03161C)

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テスタ

About テスタ

, 
機会

About 機会


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