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J-GLOBAL ID:200902113869980901   Reference number:02A0207653

Application of He-microwave induced plasma atomic emission spectroscopy to an analysis of individual particulate matter.

個々の粒状物質の分析に対する,Heマイクロ波誘導プラズマ発光分光分析(He-MIP-AES)の応用
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Issue: 15  Page: 124-132  Publication year: Nov. 2001 
JST Material Number: X0871A  ISSN: 1344-3437  Document type: Proceedings
Article type: 短報  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Geochemistry of lithosphere in general 

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