Art
J-GLOBAL ID：200902113875846230
Reference number：94A0839491
Identification of Defects Based on ECT Technique and Wavelets.
ECT技術および小波に基づく異常の同定
-
Publisher site
Copy service
{{ this.onShowCLink("http://jdream3.com/copy/?sid=JGLOBAL&noSystem=1&documentNoArray=94A0839491©=1") }}
-
Access JDreamⅢ for advanced search and analysis.
{{ this.onShowJLink("http://jdream3.com/lp/jglobal/index.html?docNo=94A0839491&from=J-GLOBAL&jstjournalNo=G0939A") }}
Author (3)：
,
,
Material：
Volume：
32nd
Page：
447
Publication year：
Mar. 1994
JST Material Number：
G0939A
Document type：
Proceedings
Country of issue：
Japan (JPN)
Language：
ENGLISH (EN)
Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
,
,
Return to Previous Page
