Application of HRTEM to studies of electronic structure and atomic configuration of interface in SiC/SiC composites.

SHIBAYAMA T; HE G W; TAKAHASHI H; KOHYAMA A

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J-GLOBAL ID：200902114072567134 Reference number：00A0592332

Application of HRTEM to studies of electronic structure and atomic configuration of interface in SiC/SiC composites.

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Material：
Volume： 10 Issue： Pr6 Page： PR6.97-PR6.103 Publication year： Apr. 2000
JST Material Number： A0743C ISSN： 1155-4339 Document type： Proceedings
Country of issue： France (FRA) Language： ENGLISH (EN)

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