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J-GLOBAL ID:200902117405290347   Reference number:00A0482887

有機物結晶の電子線照射損傷

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Material:
Volume: 20  Page: 234-235  Publication year: Dec. 01, 1999 
JST Material Number: X0320A  Document type: Year Book
Article type: 短報  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Electron and ion microscopes  ,  Microscopy determination of structures 
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