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J-GLOBAL ID：200902119507046419   Reference number：99A0674877

GaN: Processing, defects, and devices.

GaN プロセッシング,欠陥および素子
Author (4)：
PEARTON S J

About PEARTON S J

(Univ. Florida, Florida)

About Univ. Florida, Florida

, 
ZOLPER J C

About ZOLPER J C

(Office of Naval Res., Virginia)

About Office of Naval Res., Virginia

, 
SHUL R J

About SHUL R J

(Sandia National Lab., New Mexico)

About Sandia National Lab., New Mexico

, 
REN F

About REN F

(Univ. Florida, Florida)

About Univ. Florida, Florida


Material：
Journal of Applied Physics  (Journal of General Physics and its Application to Other Sciences and to Industry)

About Journal of Applied Physics


Volume： 86  Issue： 1  Page： 1-78  Publication year： Jul. 01, 1999 
JST Material Number： C0266A  ISSN： 0021-8979  CODEN： JAPIAU  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
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Keywords indexed to the article.
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*gallium nitride

About gallium nitride

,...
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Lattice defects in semiconductors 
(BK12040Q)

About Lattice defects in semiconductors

,  Manufacturing technology of solid-state devices 
(NC03030V)

About Manufacturing technology of solid-state devices

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
GaN

About GaN

, 
プロセッシング

About プロセッシング

, 
欠陥

About 欠陥


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