Art
J-GLOBAL ID：200902126001838640   Reference number：01A0343923

Radiation Damage Studies of Silicon Microstrip Sensors.

シリコンマイクロストリップセンサの放射線損傷研究
Author (9)：
NAKAYAMA T

About NAKAYAMA T

(Univ. Tsukuba, Ibaraki, JPN)

About Univ. Tsukuba, Ibaraki, JPN

, 
IKEGAMI Y

About IKEGAMI Y

(High Energy Accelerator Organization (KEK), Ibaraki, JPN)

About High Energy Accelerator Organization (KEK), Ibaraki, JPN

, 
IWATA Y

About IWATA Y

(Hiroshima Univ., Hiroshima, JPN)

About Hiroshima Univ., Hiroshima, JPN

, 
JOHANSEN L G

About JOHANSEN L G

(Univ. Bergen, Bergen, NOR)

About Univ. Bergen, Bergen, NOR

, 
NAKANO I

About NAKANO I

(Okayama Univ., Okayama, JPN)

About Okayama Univ., Okayama, JPN

, 
RIEDLER P

About RIEDLER P

(CERN, Geneva, CHE)

About CERN, Geneva, CHE

, 
STAPNES S

About STAPNES S

(Univ. Oslo, Oslo, NOR)

About Univ. Oslo, Oslo, NOR

, 
TAKASHIMA R

About TAKASHIMA R

(Kyoto Univ., Kyoto, JPN)

About Kyoto Univ., Kyoto, JPN

, 
YAMAMURA K

About YAMAMURA K

(Hamamatsu Photonics K.K., Shizuoka, JPN)

About Hamamatsu Photonics K.K., Shizuoka, JPN


Material：
IEEE Transactions on Nuclear Science  (IEEE Trans Nucl Sci)

About IEEE Transactions on Nuclear Science


Volume： 47  Issue： 6,Pt.1  Page： 1885-1891  Publication year： Dec. 2000 
JST Material Number： C0235A  ISSN： 0018-9499  CODEN： IETNAE  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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*radiation damage

About radiation damage

,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
radiation resistivity

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JST classification (3)：
JST classification
Category name(code) classified by JST.
Experimental techniques for particle and nuclear physics in general 
(BE01010F)

About Experimental techniques for particle and nuclear physics in general

,  Radiation spectroscopy and spectrometers 
(AD08030U)

About Radiation spectroscopy and spectrometers

,  Irradiational changes semiconductors 
(BK16123E)

About Irradiational changes semiconductors

Terms in the title (2)：
Terms in the title
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放射線損傷

About 放射線損傷

, 
研究

About 研究


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