Enhanced Signal-to-Background Ratios in Voltammetric Measurements Made at Diamond Thin-Film Electrochemical Interfaces.

STROJEK J W; GRANGER M C; SWAIN G M; DALLAS T; HOLTZ M W

Art

J-GLOBAL ID：200902127088014687 Reference number：96A0677744

Enhanced Signal-to-Background Ratios in Voltammetric Measurements Made at Diamond Thin-Film Electrochemical Interfaces.

ダイヤモンド薄膜の電気化学界面でのボルタンメトリー測定における増感信号/バックグラウンド比

Publisher site Copy service {{ this.onShowCLink("http://jdream3.com/copy/?sid=JGLOBAL&noSystem=1&documentNoArray=96A0677744&COPY=1") }}
Access JDreamⅢ for advanced search and analysis. {{ this.onShowJLink("http://jdream3.com/lp/jglobal/index.html?docNo=96A0677744&from=J-GLOBAL&jstjournalNo=A0395A") }}

Author (5)： , , , ,
Material：
Volume： 68 Issue： 13 Page： 2031-2037 Publication year： Jul. 01, 1996
JST Material Number： A0395A ISSN： 0003-2700 CODEN： ANCHAM Document type： Article
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

,...

To see more with JDream III (charged). {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=96A0677744&from=J-GLOBAL&jstjournalNo=A0395A") }}

Electrometric analysis of inorganic compounds , Electrometric analysis in general

, , , , ,

Return to Previous Page