Scanning tunneling microscopy and atomic force microscopy study of graphite defects produced by bombarding with highly charged ions.

MOCHIJI K; YAMAMOTO S; SHIMIZU H; OHTANI S; SEGUCHI T; KOBAYASHI N

Art

J-GLOBAL ID：200902127841780983 Reference number：98A0171655

Scanning tunneling microscopy and atomic force microscopy study of graphite defects produced by bombarding with highly charged ions.

高帯電イオン衝撃により生じた黒鉛欠陥の走査トンネル顕微鏡および原子間力顕微鏡による研究

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Material：
Volume： 82 Issue： 12 Page： 6037-6040 Publication year： Dec. 15, 1997
JST Material Number： C0266A ISSN： 0021-8979 CODEN： JAPIAU Document type： Article
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

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Irradiational changes of other materials , Surface structure of solids in general

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