Art
J-GLOBAL ID：200902128514553791   Reference number：01A0578701

Density Measurements of Silicon Crystals by Hydrostatic Weighing.

静水力学的計量法によるシリコン結晶の密度測定
Author (3)：
FUJII K

About FUJII K

(National Res. Lab. Metrology, Tsukuba, JPN)

About National Res. Lab. Metrology, Tsukuba, JPN

, 
WASEDA A

About WASEDA A

(National Res. Lab. Metrology, Tsukuba, JPN)

About National Res. Lab. Metrology, Tsukuba, JPN

, 
TANAKA M

About TANAKA M

(National Res. Lab. Metrology, Tsukuba, JPN)

About National Res. Lab. Metrology, Tsukuba, JPN


Material：
IEEE Transactions on Instrumentation and Measurement  (IEEE Trans Instrum Meas)

About IEEE Transactions on Instrumentation and Measurement


Volume： 50  Issue： 2  Page： 616-621  Publication year： Apr. 2001 
JST Material Number： C0232A  ISSN： 0018-9456  CODEN： IEIMAO  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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single crystal

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,...
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Thesaurus term/Semi thesaurus term
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*molecular volume

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JST classification (1)：
JST classification
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Lattice defects in semiconductors 
(BK12040Q)

About Lattice defects in semiconductors

Terms in the title (4)：
Terms in the title
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静水力学

About 静水力学

, 
計量法

About 計量法

, 
シリコン結晶

About シリコン結晶

, 
密度測定

About 密度測定


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