Long-term Reliability Evaluation of Power Semiconductor Devices Used in Substation Rectifiers.

HORIUCHI T; SUGAWARA Y

Art

J-GLOBAL ID：200902130765524558 Reference number：99A0017777

Long-term Reliability Evaluation of Power Semiconductor Devices Used in Substation Rectifiers.

変電所整流器に用いられる電力半導体素子の長期信頼性評価

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Author (2)： ,
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Page： 195-198 Publication year： 1998
JST Material Number： K19980600 ISBN： 0-7803-4752-8 Document type： Proceedings
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

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Thyristors , Measurement,testing and reliability of solid-state devices

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