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J-GLOBAL ID：200902132000516827   Reference number：93A0636937

Characterization of highly conducting wire gratings using an electromagnetic theory of diffraction.

電磁回折理論を使った高伝導性ワイヤ格子の特性評価
Author (2)：
LOCHBIHLER H

About LOCHBIHLER H

(Max Planck Inst. Extraterrestrische Physik, Garching bei Muenchen, DEU)

About Max Planck Inst. Extraterrestrische Physik, Garching bei Muenchen, DEU

, 
DEPINE R A

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(Univ. Buenos Aires, Buenos Aires, ARG)

About Univ. Buenos Aires, Buenos Aires, ARG


Material：
Optics Communications  (Opt Commun)

About Optics Communications


Volume： 100  Issue： 1/4  Page： 231-239  Publication year： Jul. 01, 1993 
JST Material Number： A0678B  ISSN： 0030-4018  Document type： Article
Article type： 原著論文  Country of issue： Netherlands (NLD)  Language： ENGLISH (EN)
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fine line

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JST classification (1)：
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X-ray instruments and techniques 
(BA02060D)

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Terms in the title (5)：
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電磁回折

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, 
理論

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, 
ワイヤ

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, 
格子

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, 
特性評価

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