Art
J-GLOBAL ID：200902133163350213   Reference number：00A0525765

Bridge Fault Diagnosis Using Stuck-At Fault Simulation.

縮退故障シミュレーションを用いたブリッジ故障診断
Author (2)：
WU J

About WU J

(Sun Microsystems, CA, USA)

About Sun Microsystems, CA, USA

, 
RUDNICK E M

About RUDNICK E M

(Univ. Illinois, IL, USA)

About Univ. Illinois, IL, USA


Material：
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  (IEEE Trans Comput-Aided Des Integr Circuits Syst)

About IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems


Volume： 19  Issue： 4  Page： 489-495  Publication year： Apr. 2000 
JST Material Number： B0142C  ISSN： 0278-0070  CODEN： ITCSDI  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
*failure analysis

About failure analysis

,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=00A0525765&from=J-GLOBAL&jstjournalNo=B0142C") }}
JST classification (1)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
縮退故障

About 縮退故障

, 
シミュレーション

About シミュレーション

, 
ブリッジ

About ブリッジ

, 
故障診断

About 故障診断


Return to Previous Page

TOP

BOTTOM