Mechanism of Improvement of Resistance Degradation in Y-doped BaTiO<sub>3</sub> Based MLCCs with Ni Electrodes under Highly Accelerated Life Testing.

SATO S; NAKANO Y; SATO A; NOMURA T

Art

J-GLOBAL ID：200902133326506844 Reference number：99A0653570

Mechanism of Improvement of Resistance Degradation in Y-doped BaTiO₃ Based MLCCs with Ni Electrodes under Highly Accelerated Life Testing.

高度加速寿命試験下でのNi電極付きYドープBaTiO₃基MLCCの抵抗劣化の改良機構

Publisher site Copy service {{ this.onShowCLink("http://jdream3.com/copy/?sid=JGLOBAL&noSystem=1&documentNoArray=99A0653570&COPY=1") }}
Access JDreamⅢ for advanced search and analysis. {{ this.onShowJLink("http://jdream3.com/lp/jglobal/index.html?docNo=99A0653570&from=J-GLOBAL&jstjournalNo=E0801B") }}

Author (4)： , , ,
Material：
Volume： 19 Issue： 6/7 Page： 1061-1065 Publication year： 1999
JST Material Number： E0801B ISSN： 0955-2219 Document type： Article
Article type：原著論文 Country of issue： United Kingdom (GBR) Language： ENGLISH (EN)

,...

To see more with JDream III (charged). {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=99A0653570&from=J-GLOBAL&jstjournalNo=E0801B") }}

LCR parts , Properties of ceramics and ceramic whiteware

, , , , ,

Return to Previous Page

Mechanism of Improvement of Resistance Degradation in Y-doped BaTiO3 Based MLCCs with Ni Electrodes under Highly Accelerated Life Testing.

Mechanism of Improvement of Resistance Degradation in Y-doped BaTiO₃ Based MLCCs with Ni Electrodes under Highly Accelerated Life Testing.